Skip to main content
Sister Publication Links
  • Rubber & Plastics News
Subscribe
  • My Account
  • LogIn
  • News
  • Technology Focus
    • Features
    • Technical Papers
    • Analysis: Rubber mixing plants of the future
      Analysis: US probes dumping by ESBR suppliers
      Opinion: Tire labels stuck in a rut
      Analysis: NR pricing takes one step forward, two steps back
    • White paper: Role of tire innerliners in improving 'in-use rolling resistance'
      White paper: Why tire air retention matters now more than ever
      Nippon Soda: Use of 1,2-polybutadiene in CSM rubber applications
      Elastomers for Sustainability Top 10
  • Events
    • ERJ Events
    • ERJ Livestreams & Webinars
    • Industry Events
    • Journey to Automation Awards 2020
      Sustainability: Top 10 E4S projects table
  • Maps & Reports
  • People
  • Directory
  • Digital Edition
  • Brainiac
MENU
Breadcrumb
  1. Home
  2. News
November 13, 2013 12:00 AM

XEI Scientific reports novel approach to removing silicone-based contamination

ERJ Staff
  • Tweet
  • Share
  • Share
  • Email
  • More
    Print

    ERJ staff report (TP)

    Redwood City, California − XEI Scientific announced the publication of a paper in collaboration with General Electric's Global Research Center on the use of in-situ plasma cleaning. The paper appears in the Journal of Vacuum Science & Technology A, reported Nanotechnology Now

    The press release said: “Contamination, even at extremely low levels, can often hide or distort analyses of surfaces that researchers would like to study. Such is the case of many of the samples analysed at General Electric's Global Research Center in New York. Attempts to study ‘as received’ samples by time of flight secondary ion mass spectrometry (ToF-SIMS) reveal a contamination signature that has come from processing, handling and/or a specific exposure.

    “ToF-SIMS provides high surface specificity so that contamination by hydrocarbons and/or silicones may actually mask the surface features of interest, which may inhibit or compromise accurate analysis. While use of remote plasmas to mitigate hydrocarbon contamination is established technology, this paper represents the first demonstration that silicones (in this case, polydimethylsiloxame) can be removed as well.”

    In the paper, "In-situ plasma cleaning of samples to remove hydrocarbon and/or polydimethylsiloxame prior to ToF-SIMS analysis1", lead author Vincent Smentkowski reports on the use of an Evactron air-based remote plasma for cleaning of samples.

    The press release added: “This approach is preferred to sputter cleaning as the latter often changes the chemistry on the surface under analysis. Here, samples were cleaned in the load lock of a commercially available ToF-SIMS instrument immediately prior to analysis. The experimental observations show that the Evactron system produces no ion beam effects (sputtering) with even extended exposure, thus showing minimal artifacts from material removal and ion bombardment. This advantage results from the design of the Evactron RF plasma cleaner which minimises ion formation and downstream sputtering, allowing radical species to dominate the cleaning process.

    “It is interesting to note that plasmas generated using ambient air result in surface oxidation and this is often beneficial through the increase in sensitivity of ToF-SIMS where the ion yield of many elements is enhanced. This paper demonstrates the potential for the use of plasma cleaning not only for basic analyses but in a production environment as well.”

    XEI Scientific was founded in 1991 and is based in Redwood City, California.


    This is an external link and should open in a new window. If the window does not appear, please check your pop-up blocking software. ERJ is not responsible for the content of external sites.

    Full story from Nanotechnology Now

    RECOMMENDED FOR YOU
    GRI launches phase 2 of $100m speciality tire project
    GRI launches phase 2 of $100m speciality tire project
    India decides against extending carbon black duties
    India decides against extending carbon black duties
    ANRPC upgrades forecasts for rubber supply and demand
    ANRPC upgrades forecasts for rubber supply and demand
    Free Newsletters

    Breaking news and in-depth coverage of essential topics delivered straight to your inbox.

    Subscribe today

    Get the latest news impacting the European rubber industry, from breaking news to razor-sharp analysis, in print and online.

    Subscribe now
    Connect with Us
    • LinkedIn
    • Twitter
    • Youtube

    Logo
    Contact Us

    @ 2019 European Rubber Journal. All rights reserved.
    Contact Us European Rubber Journal, Crain Communication LTD, Ground Floor 11 Ironmonger Lane, London EC2V 8EY, UK

    Customer Service:
    1-313-446-0450

    Resources
    • About us
    • Contact Us
    • Staff
    • Advertise with Us
    • Media Kit
    • Careers
    • Ad Choices Ad Choices
    • Sitemap
    Legal
    • Terms and Conditions
    • Privacy Policy
    • Privacy Request
    Copyright © 1996-2021. Crain Communications, Inc. All Rights Reserved.
    • News
    • Technology Focus
      • Features
      • Technical Papers
    • Events
      • ERJ Events
      • ERJ Livestreams & Webinars
      • Industry Events
    • Maps & Reports
    • People
    • Directory
    • Digital Edition
    • Brainiac